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Publication | Beamlines | Type | Strategic Pillar |
---|---|---|---|
Wells, Garth; Achenbach, Sven; Klymyshyn, David; Jacobs, Michael; Mazhar, Waqas et al. (2019). High-Aspect-Ratio Micropatterning Capabilities into Thick Resist Layers Using Deep X-ray Lithography at SyLMAND. Synchrotron Radiation News 32(4) , 44-47. 10.1080/08940886.2019.1634438. | SYLMAND | Peer-Reviewed Article | Materials |
Berkenbrock, José-Alvim; Machado, Rafaela Grecco; Achenbach, Sven (2018). How Might X-Ray Scanned Potatoes Improve Cancer Treatment?. Microscopy and Microanalysis 24(S2) , 410-411. 10.1017/s1431927618014332. | SYLMAND | Peer-Reviewed Article | Materials |