Publication Beamlines Strategic Pillar
Banerjee, Neil R.; Van Loon, Lisa L.; Quirt, David (2018). XRF Microscopy and Boron K-edge XANES Analysis of Bulk Rock Samples Associated with Uranium Deposits. Microscopy and Microanalysis 24(S2) , 508-509. 10.1017/s1431927618014769. IDEAS, VLS-PGM Environment
Dynes, James J.; Arthur, Zachary; Read, Stuart; Stobbs, Jarvis; Regier, Tom Z. et al. (2018). Correlative Spectromicroscopy Software Development on the SGM and Mid-IR Beamlines at the CLS. Microscopy and Microanalysis 24(S2) , 494-495. 10.1017/s1431927618014708. MID-IR, SGM Environment