Publication Beamlines Strategic Pillar
Motamedi, Pouyan; Bosnick, Ken; Cadien, Ken; Hogan, James D. (2018). In Situ Synchrotron X-Ray Diffraction Analysis of Phase Transformation in Epitaxial Metastable hcp Nickel Thin Films, Prepared via Plasma-Enhanced Atomic Layer Deposition. Advanced Materials Interfaces 5(24) , 1800957. 10.1002/admi.201800957. IDEAS Materials
Reid, Joel; Schmidt, Ken; Warrender, Neil; Bergen, Erika; Cutler, Jeffrey et al. (2016). Multifaceted Solution of Analytical Challenges in Complex Oilfield Materials With Synchrotron Techniques. SPE Journal 22(03) , 875-880. 10.2118/185164-pa. CMCF-BM, SGM Materials